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Zeiss SCAI Film Scanner

How we tested the Zeiss SCAI Scanner for use with EM negatives


  • Scan image of EM grid provided by Richard Henderson at 7um interval
  • OD range 0.1-1.4
    linearity 0%
    no color correction
    monochrome mode
    Zeiss proprietary lookup table (LUT) 
  • TLD2MRC or TIF2MRC to convert to MRC format
  • Ximdisp (or LABEL) to select area 512x512 pixels
  • FFTRANS to calculate fft of selected area
  • LABEL (option 5) to output intensities from fft
  • Ximdisp to display intensities
  • choose "average boxed densities"
    draw box around each spot along x direction and around background near each spot
    same for y direction:  
  • Calculate integrated amplitude for each reflection
  • integrated amp = sqrt( (measureed avg intensity - bkg avg intensity) * num of pixels)
    e.g., in above image, 1 listed spot (1st order x direction) would be:  222.17 = sqrt( ( 57.72-0.59)*864)
  • Finally, calculate ratio of 2nd, 3rd, 4th order spots relative to 1st order spot in both x and y direction

  • Values calculated at various times on various scanners all from copies of this image

    10/28/99  Our scanner immediately after installation
    order        lowerleft           lowerright            middle
             x        y              x       y            x        y
     1      1.0      1.0            1.0     1.0          1.0      1.0
     2      0.384    0.415          0.375   0.407        0.379    0.410
     3      0.0738   0.0964         0.0695  0.0911       0.0720   0.0943
     4      0.0363   0.0335         0.0347  0.0310       0.0358   0.319

    order        upperleft           upperright
             x        y              x       y
     1      1.0      1.0            1.0     1.0
     2      0.383    0.417          0.371   0.405
     3      0.0746   0.0987         0.0680  0.0910
     4      0.0367   0.0356         0.0345  0.0360
     

    9/28/99  Our scanner at factory (by Klaus Neumann)
    order        lowerleft           lowerright            middle
             x        y              x       y            x        y
     1      1.0      1.0            1.0     1.0          1.0      1.0
     2      0.398    0.434          0.370   0.410        0.388    0.422
     3      0.887    0.114          0.710   0.098        0.0816   0.107
     4      0.0287   0.0282         0.0247  0.0250       0.0284   0.0290

    order        upperleft           upperright
             x        y              x       y
     1      1.0      1.0            1.0     1.0
     2      0.390    0.427          0.383   0.416
     3      0.0831   0.108          0.0785  0.103
     4      0.0281   0.0282         0.0251  0.0269
     

    7/16/99  (from Klaus Neumann - 2 different focusses)
    order  scan001x scan001y    scan002x  scan002y
           (emgrid1)             (emgrid2)
     1      1.0      1.0           1.0      1.0
     2      0.40     0.436         0.31     0.333
     3      0.086    0.114         0.040    0.054
     4      0.025    0.026         0.015    0.017
     

    7/22/99  (followup to Gordon Conf)
    order        lowerleft           lowerright            middle
             x        y              x       y            x        y
     1      1.0      1.0            1.0     1.0          1.0      1.0
     2      0.396    0.428          0.387   0.428        0.380    0.412
     3      0.086    0.111          0.080   0.110        0.0764   0.100
     4      0.027    0.027          0.0277  0.0298       0.0258   0.0260

    order        upperleft           upperright
             x        y              x       y
     1      1.0      1.0            1.0     1.0
     2      0.397    0.426          0.398   0.432
     3      0.086    0.110          0.0867  0.107
     4      0.0262   0.0250         0.0278  0.0273

    7/10/99  PDS1010GM (NYU) (same data as previously provided)
             x         y
    1       1.0       1.0
    2       0.488     0.490
    3       0.114     0.143
    4       0.048     0.040     



     

    Acceptance criteria specified at time of the order:

    An electron micrograph of a 400 mesh electron microscope grid
    (provided by Richard Henderson will be scanned at a 7 um interval.
    Scans of this image will be made in the center as well as at each
    corner of the platten and equal quality will be expected at each of
    these positions as detailed below.

    A 512x512 pixel image will be Fourier transformed and the integrated
    intensity of four "spots" will be determined both along two
    orthogonal directions, after subtracting the local background (using
    the "Average box densities" function in the program Ximdisp).  These
    directions will be slightly askew to the scan axis to accomodate our
    method for integrating the spot intensities (see attached Fourier
    transform).  The integrated amplitudes will be calculated as the
    square root of these integrated intensities.  Amplitudes will be
    normalized by dividing them by the amplitude of the 1st order spot.
    The "standard" data will come from the flatbed, PMT-based scanner in
    Cambridge made by Joyce-Loebl; this performs roughly the same as the
    PDS 1010GM currently in my laboratory (data shown below).

    We will require that the normalized amplitude for the 4th order spot
    be at least 50% of that from the flat-bed scanner in both directions
    and at all locations on the scanner platten (that is a normalized
    amplitude of 0.020).

    I would really like to convince you to make these scans at the
    factory and to send them to me prior to shipment (e.g. by email) so I
    can verify the proper functioning of the instrument.  This analysis
    will only take me a couple of hours and could save you the expense
    and me the inconvenience of replacing the optics (or the whole
    instrument) after installation.