Image Core Facility -
CM200 FEG Microscope
This is our Philips CM200 cryoelectron microscope for high resolution
structure determination with field emission gun, which is operated
at 200 kV. The microscope is equiped with electronic cameras from Gatan
Corp. and low temperature specimen holders from Oxford
Instruments. Associated personal computers allow digital
image acquisition and speciallized imaging protocls, such as spot
scan.
In addition to simplified controls as those of CM12 TEM, the most distinctive
charateristics of this microscope are its Field Emission Gun (FEG) and Computer-controled
Sample Stage (CompuStage). The FEG drastically increases beam coherence and brightness,
substantially improving image quality with much higher resolution. The CompuStage
results in higher operational accuracy and reproducibility that could hardly
be achieved in the past.
Main Features of the Microscope
High Tension |
20 - 200kV in 40-kV increments |
Extractor Voltage |
Set at 4 kV maximum |
Magnification |
50 - 750,000x |
Camera Length |
30 - 265mm |
Resolution |
0.27nm(point), 0.14nm(line) |
Column Vacuum |
Ultimate Pressure = 2.7x10-5Pa
(IGP = 18) |
X-Y Movement:
Max. travel: 2mm
Max. speed: 0.08mm/s.
Step resolution: 2nm
Reproducibility: 500nm
Drift: 1nm/2min
Loop: 100nm |
Z Movement:
0.75mm
10mm/s.
0.036mm
0.5um
Meas. resolution: 7nm |
Tilt Movement:
+-45º
10º/s.
0.04º/s.
0.5º
0.01º
Eucentricity: 1.0um |
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Focussing
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0.3um-10mm(LM Range), 3nm-100nm(M/SA Range) |
Spot Size |
10um-200nm(LM Mode), 2.0um-40nm(Microprobe),
100nm-2nm(Nanoprobe) |
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